Memory test and burn-in for 5G development labs

Author: EIS Release Date: Jul 13, 2020


Advantest’s H5620ES engineering test system is designed for burn-in and core testing of DDR4, DDR5 and LPDDR devices in laboratory environments.

Advantest-H5620ES-memory-tester

“Like its sister system, the H5620 production unit, the new tester parallel tests both DDR4 and DDR5 memories. It can accommodate memory ICs with 100MHz frequencies and 200Mbit/s data rates,” said the company, adding that H5620ES streamlines the number of accessories and “its open-top architecture makes it easy to perform pick-and-place operations without removing the device interface board”.

Both machines run the same ‘FutureSuite’ operating system, enabling testing with the same waveform. It also allows pre-testing routines, such as contact checking, to be conducted on the H5620ES system before transfer to the H5620 production tester.

“H5620ES meets all challenges in developing and qualifying the newest data-storage ICs that are in demand for the 5G market,” said Advantest v-p Takeo Miura.

Shipments are expected to begin in the second quarter of this fiscal year.