ON Semiconductor has introduced a single point direct Time-of-Flight (dToF) LiDAR solution enabled by the company’s Silicon Photomultiplier (SiPM)

LiDAR  is typically based upon the dToF method, which measures the time it takes for a pulse of light, normally in the Near Infrared (NIR) wavelength range, to travel to and from an object.
To determine range accurately, the receiver needs to capture as much of the signal as possible. Traditional photodiodes suffer here, in terms of response time and sensitivity.

The Silicon Photomultiplier (SiPM) sensor developed by ON Semiconductor, overcomes these shortfalls by providing faster response times and high detection efficiency.

The reference platform uses the RB-Series, ON Semiconductor’s second generation of SiPM sensors, which deliver improved performance in red and the NIR range.
ON’s SiPM dToF LiDAR Platform provides a low cost, single point LiDAR that OEMs can adapt and take into production to create industrial range finding applications.
It includes the NIR laser diode, SiPM sensor and optics, as well as the digital processing necessary to convert the detected signals into elapsed time, and elapsed time into distance.
To accelerate customers’ time to market, ON Semiconductor has made all of the design data for the reference platform available, covering the schematics, BoM, gerber files, and PCB design files.
A PC-based GUI is also accessible, which provides a graphical representation of the measurements over time. The histograms generated provide further evidence of the system’s capabilities in applications such as range finding, collision detection and 3D mapping.
The SiPM dToF LiDAR Platform can detect objects at distances between 10 cm and 23 m. It offers an out-of-the-box experience using the provided GUI, which allows engineers to start evaluating the technology immediately.
The design is FDA Class 1 certified and compliant with IEC / EN 60825-1:2014 and 21 CFR 1040.10/ 1040.11 laser safety standards.