Watch the video below, where Lee Harrison – Director of Automotive IC Solutions at Siemens EDA – explains the technology behind full In-System ATPG testing for advanced semiconductors

Continuous testing and monitoring of devices is required to guarantee optimal performance, reliability and safety throughout their operation, he explains. Tessent In-System Test enables the application of high-quality deterministic test patterns for in-system/in-field testing during the lifecycle of your chip.

Learn more about ATPG (Automatic Test Pattern Generation and Automatic Test Pattern Generator) testing and using SSN (Streaming Scan Network) and Siemens’ Tessent In-System Test software.