Microchip is aiming at engineers make accurate measurements of frequency signals, including those generated by atomic clocks and other high-performance frequency references with a phase noise analyser.

Called 53100A, it works up to 200MHz and characterises the phase noise, jitter, Allan deviation (ADEV) and time deviation (TDEV) – with a variety of configurations by allowing up to three separate devices to be tested simultaneously using a single reference.

“At 344 x 215 x 91mm, the phase noise test instrument is small enough for integration into manufacturing ATE systems, yet powerful enough for laboratory-grade metrology,” according to the company. “Its interface provides backward compatibility with Microchip’s 51xxA test sets’ command and data stream, reducing the need to redesign existing ATE infrastructure.”

An input reference device can be connected through the front panel at a different nominal frequency than the device under test, allowing a single reference to characterise a variety of oscillator products. “Rubidium frequency standards such as Microchip’s 8040C-LN or a quartz oscillator such as Microchip’s 1000C OCXO could be used as a reference, as well as other manufacturers’ precise oscillators,” said the company.

Applications are expected with oscillators for 5G networks, data centres, commercial aircraft systems, military aircraft systems, space vehicles, communication satellites and metrology.